MCP imaging test 5
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開始行:
[[RIKEN TEST WORK]]
*Amp out picture- MCP-front,x1,y2 [#ue031154]
&ref(./20100911.png,50%);
&ref(./20100911-2.png,50%);
&ref(./20100911-3-teikaku-mcpf_y2_y1_x1.png,50%);
&ref(./20100911-4-teikaku.png,50%);
&ref(./20100911-5.png,50%);
&ref(./20100911-6.png,50%);
&ref(./20100911-7.png,50%);
&ref(./20100911-8.png,50%);
&ref(./20100911-10.png,50%);
&br;
すべて:青MCPF、水色Y2,いずれもアンプ反転出力.
&br;
電圧を変化させるごとに、信号の性質も変化しているようだ. MCPF = 300, MCPB = 2600, holder=2600, ref = 2450, coll = 2550
*目的・方法 [#q6cf66b7]
-β線源(Sr90, 1MBq @ 2008/2/28)をMCP表面中心上方15cmの位置に配置。In order to check the resolution roughly,The aluminum mask(thickness = 0.51mm, hole diameter = 3mm, pitch = 5 / 9 mm , half cell shift) was put on the MCP front ceramic ring directory. Then distance from MCPfront to mask is <5mm, it may be sufficient to take the 2D pattern.
*状況 [#r22ddf97]
-Imaging test 3のときと、MCPの位置,線源の状況は変化していない。
-印加電圧:300, 2700,2700,2950,3000V (front, holder,back,reference,collection)から初めて、バイアス電圧、ワイヤー電圧、スレッショルドをスキャンする
-threshold : ワイヤー -50mV全て(波高の50%程度)MCP 175,375
*結果 [#d35fabb7]
TDC anbalance - as shown in Y1 and Y2 TDC histogram, there is the area which can be seen that is inefficient. Now, we see the TDC-ADC plot, considerably correlation: X1 and X2, it may not have any unbalance in TDC spectrum. in ADC spectrum of X2 and X1, the symmetrical specrum can be seen; but, Y1 and Y2, in ADC spectrum, we can cleary seen that low(/high) value of TDC ch in Y1(Y2),ADC distribution is poisson distribution of small N.
*メモ書き [#off85023]
-ランシート
|#run|MCPf[V]|MCPb[V]|Holder[V]|Ref.w[V]|Coll.w[V]|MCPf.Th[mV]|X1.Th[mV]|X2.Th[mV]|Y1.Th[mV]|Y2.Th[mV]|ADCdata|Note|
|#0126|300|2700|2700|2950|3000|-375|-50|-50|-50|-50|w/||
|#0127|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|600Hz|
|#0128|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|changed:comp.veto.width = 1.2msec.250Hz|
|#0129|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|250Hz|
|#0130|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|using updating type discri, width minimum = 160ns, misscount = 0 250Hz|
|#0131|250|2650|2650|2900|2950|-175|-50|-50|-50|-50|w/|all HV -50V|
**Voltage scan [#oa2a1631]
-base
#0091
-delay - offset problem
#0080,0081
-ref voltage scan
--#103(2700),#104(2725) @ 2.35kV bias
--#121(2950),#122(2975),#123(2925)@2.4kV bias
-collection voltage scan
-ref/col v scan
--#0094(2650,2700),#0095(2700,2710)@2.35kV bias th = base
-h, ref/col v scan
--#101(2600,2650,2700),#102(2650,2700,2750) @ 2.3kV bias th=base
--#94(2600,2650,2700),#103(2650,2700,2750) @ 2.35kV bias th=base
-holder voltage scan
--#0075(2600),#0076(2650),#0077(2550) bias2.2kV th=base
--#0104(2650),#0105(2700) bias 2.35kV th = base
--#0124(2700),#0125(2800) bias 2.4kV check threshold of MCPf(-375mV)
*データセット [#c0145aa2]
**定格バイアス2.4kVでのデータセット [#w45d59d5]
-r/c voltage (収集効率)
--#106(r,c=2725,2750),#107(2750,2800),#108(2800,2850),#109(2850,2900),th=base
-MCPf th scan(energy v.s. 収集効率, tdc-adc相関)
--#109(-175mV),#110(-250mV),#111(-375mV)
--#117(-375mV),#118(-500mV)::wire th -200mV
--#123(-175mV),#124(-375mV)::wire -50mV
-Wire th scan(energy)
--#112(-50mV),#115(-25mV),#116(-100mV),#117(-200mV),f th -375mV
--#113(-50mV),#114(-25mV),f th=-250mV
---上の2つのデータセットで、電圧は同じ
-Holder voltage(電場整形)
--#124(2700V),#125(2800V), f th=-375mV wire -50mV
-ref voltage(収集効率)
--#121(2950),#122(2975),#123(2925) fth -175mV, wire-50mV
**bias2.35kVでのデータセット (th = base) [#jfa59580]
-h/r/c scan
--#0094(2600,2650,2700),#0103(2650,2700,2750)
-h/r/c balance
--#0103(2650,2700,2750),#0105(2700,2725,2750)
-r/c scan
--#0094(2650,2700),#0095(2700,2710) where h 2600
-r scan
--#0103(2700),#0104(2725) where c 2750 , h2650
**bias2.3kVでのデータセット(th=base) [#h2f0d8ab]
-h/r/c scan
--#101(2600,2650,2700),#102(2650,2700,2750) th = base
**bias 2.2kVでのデータセット(th=base)(#0078=#0100) [#h0c69cb1]
-front voltage scan
--#0097(250),#0098(200),#0100(300)=base
-holder voltage scan
--#0076(2650),#0077(2550),#0078(2600)=base
-front-back voltage scan
--#0099(200-2400),#0100(300-2500)=base
*メモ2 [#n211a9a5]
-表裏問題:sumの値(中央値のみ)adcの値(小さい)
&br;
-図
--上左 surf map of run0075 (bias 2.2kV)
--上中 surf map of run0110 (bias 2.4kV)
*sum -sub split structure [#ebd56f4f]
終了行:
[[RIKEN TEST WORK]]
*Amp out picture- MCP-front,x1,y2 [#ue031154]
&ref(./20100911.png,50%);
&ref(./20100911-2.png,50%);
&ref(./20100911-3-teikaku-mcpf_y2_y1_x1.png,50%);
&ref(./20100911-4-teikaku.png,50%);
&ref(./20100911-5.png,50%);
&ref(./20100911-6.png,50%);
&ref(./20100911-7.png,50%);
&ref(./20100911-8.png,50%);
&ref(./20100911-10.png,50%);
&br;
すべて:青MCPF、水色Y2,いずれもアンプ反転出力.
&br;
電圧を変化させるごとに、信号の性質も変化しているようだ. MCPF = 300, MCPB = 2600, holder=2600, ref = 2450, coll = 2550
*目的・方法 [#q6cf66b7]
-β線源(Sr90, 1MBq @ 2008/2/28)をMCP表面中心上方15cmの位置に配置。In order to check the resolution roughly,The aluminum mask(thickness = 0.51mm, hole diameter = 3mm, pitch = 5 / 9 mm , half cell shift) was put on the MCP front ceramic ring directory. Then distance from MCPfront to mask is <5mm, it may be sufficient to take the 2D pattern.
*状況 [#r22ddf97]
-Imaging test 3のときと、MCPの位置,線源の状況は変化していない。
-印加電圧:300, 2700,2700,2950,3000V (front, holder,back,reference,collection)から初めて、バイアス電圧、ワイヤー電圧、スレッショルドをスキャンする
-threshold : ワイヤー -50mV全て(波高の50%程度)MCP 175,375
*結果 [#d35fabb7]
TDC anbalance - as shown in Y1 and Y2 TDC histogram, there is the area which can be seen that is inefficient. Now, we see the TDC-ADC plot, considerably correlation: X1 and X2, it may not have any unbalance in TDC spectrum. in ADC spectrum of X2 and X1, the symmetrical specrum can be seen; but, Y1 and Y2, in ADC spectrum, we can cleary seen that low(/high) value of TDC ch in Y1(Y2),ADC distribution is poisson distribution of small N.
*メモ書き [#off85023]
-ランシート
|#run|MCPf[V]|MCPb[V]|Holder[V]|Ref.w[V]|Coll.w[V]|MCPf.Th[mV]|X1.Th[mV]|X2.Th[mV]|Y1.Th[mV]|Y2.Th[mV]|ADCdata|Note|
|#0126|300|2700|2700|2950|3000|-375|-50|-50|-50|-50|w/||
|#0127|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|600Hz|
|#0128|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|changed:comp.veto.width = 1.2msec.250Hz|
|#0129|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|250Hz|
|#0130|300|2700|2700|2950|3000|-175|-50|-50|-50|-50|w/|using updating type discri, width minimum = 160ns, misscount = 0 250Hz|
|#0131|250|2650|2650|2900|2950|-175|-50|-50|-50|-50|w/|all HV -50V|
**Voltage scan [#oa2a1631]
-base
#0091
-delay - offset problem
#0080,0081
-ref voltage scan
--#103(2700),#104(2725) @ 2.35kV bias
--#121(2950),#122(2975),#123(2925)@2.4kV bias
-collection voltage scan
-ref/col v scan
--#0094(2650,2700),#0095(2700,2710)@2.35kV bias th = base
-h, ref/col v scan
--#101(2600,2650,2700),#102(2650,2700,2750) @ 2.3kV bias th=base
--#94(2600,2650,2700),#103(2650,2700,2750) @ 2.35kV bias th=base
-holder voltage scan
--#0075(2600),#0076(2650),#0077(2550) bias2.2kV th=base
--#0104(2650),#0105(2700) bias 2.35kV th = base
--#0124(2700),#0125(2800) bias 2.4kV check threshold of MCPf(-375mV)
*データセット [#c0145aa2]
**定格バイアス2.4kVでのデータセット [#w45d59d5]
-r/c voltage (収集効率)
--#106(r,c=2725,2750),#107(2750,2800),#108(2800,2850),#109(2850,2900),th=base
-MCPf th scan(energy v.s. 収集効率, tdc-adc相関)
--#109(-175mV),#110(-250mV),#111(-375mV)
--#117(-375mV),#118(-500mV)::wire th -200mV
--#123(-175mV),#124(-375mV)::wire -50mV
-Wire th scan(energy)
--#112(-50mV),#115(-25mV),#116(-100mV),#117(-200mV),f th -375mV
--#113(-50mV),#114(-25mV),f th=-250mV
---上の2つのデータセットで、電圧は同じ
-Holder voltage(電場整形)
--#124(2700V),#125(2800V), f th=-375mV wire -50mV
-ref voltage(収集効率)
--#121(2950),#122(2975),#123(2925) fth -175mV, wire-50mV
**bias2.35kVでのデータセット (th = base) [#jfa59580]
-h/r/c scan
--#0094(2600,2650,2700),#0103(2650,2700,2750)
-h/r/c balance
--#0103(2650,2700,2750),#0105(2700,2725,2750)
-r/c scan
--#0094(2650,2700),#0095(2700,2710) where h 2600
-r scan
--#0103(2700),#0104(2725) where c 2750 , h2650
**bias2.3kVでのデータセット(th=base) [#h2f0d8ab]
-h/r/c scan
--#101(2600,2650,2700),#102(2650,2700,2750) th = base
**bias 2.2kVでのデータセット(th=base)(#0078=#0100) [#h0c69cb1]
-front voltage scan
--#0097(250),#0098(200),#0100(300)=base
-holder voltage scan
--#0076(2650),#0077(2550),#0078(2600)=base
-front-back voltage scan
--#0099(200-2400),#0100(300-2500)=base
*メモ2 [#n211a9a5]
-表裏問題:sumの値(中央値のみ)adcの値(小さい)
&br;
-図
--上左 surf map of run0075 (bias 2.2kV)
--上中 surf map of run0110 (bias 2.4kV)
*sum -sub split structure [#ebd56f4f]
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